+ Overview
+ Types Of FAS
    + Destructive
    + Non-Destructive
+ Silterra FAS Capabilities
+ Handling Procedures
+ FAS Request Form



Failure Analysis Service
 
Silterra FAS  Tools

 

 

Focus Ion Beam (FIB)

 

Reactive Ion Etcher (RIE)
 

Photon Emission Microscopy & Scanning Laser Optical Microscope
 

TEM
 

FE - SEM
 

AFP Nanoprober and Parametric Analyzer
 

Cross sectioning to check for Bond pad structure and Solder bump integrity
   
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