Silterra Malaysia Sdn. Bhd. : Wafer Foundry

Failure Analysis Service

Types of Failure Analysis Services

Non - Destructive Failure Analysis

FA Technique	Applications
Electrical Parametric Analysis	Validate functionality of DC performance of IC;
Bitmap Engineering + Auto Prober	Test for bitmapping to locate failed bit location;
Optical / UV Microscopy	High magnification inspection up to 1,500x;