MPW Program

MyFab

Vendor Management

Failure Analysis Service

Types of FAS

Destructive

Non-Destructive

Silterra FAS Capabilities

Handling Procedures

FAS Request Form

Photo Mask Service

Failure Analysis Service
Non-Destructive Failure Analysis   FA Technique Applications Electrical Parametric Analysis Validate functionality of DC performance of IC; Bitmap Engineering + Auto Prober Test for bitmapping to locate failed bit location; Optical / UV Microscopy High magnification inspection up to 1,500x;